holder

The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.


Calibration of Infrared Cells

Volume 20, Number 2 (April 1966) Page 116-117

Burrill, A.M.


To minimize the error caused by cell thickness changes, we have made it a practice to recalibrate our cells frequently by scanning ten to twenty interference fringes in triplicate and calculating the thickness from the equation

t=n/2(f1-f2). (1)

This was a costly operation, and it occurred to us that, since the interference pattern is a function of cell thickness, the frequencies at which the transmission maxima occur are also functions of the cell thickness. Thus we should be able to measure the cell thickness from the transmission maximum of a single interference fringe.