The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.

Layered Synthetic Microstructures as Dispersing Devices in X-ray Spectrometers

Volume 36, Number 1 (Feb. 1982) Page 58-61

Gilfrich, J.V.; Nagel, D.J.; Barbee, T.W.

Layered synthetic microstructures (LSM's) are useful dispersing devices for x-ray spectroscopy. They can be produced with virtually any layer spacing (d) greater than approximately 10 Å and they have high diffraction efficiency. Integral reflection coefficients for such structures made up of alternating layers of a transition metal and carbon are 3 to 10 times greater than values for other dispersing elements used in the moderate to long wavelength region of the x-ray spectrum. Resolving power of the LSMs is somewhat poorer than crystals at this time but is sufficient to permit significant applications.