The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.
Application of Factor Analysis to the Resolution of Overlapping XPS Spectra
Volume 36, Number 4 (Aug. 1982) Page 428-430
Gilbert, R.A.; Llewellyn, J.A.; Swartz, W.E.; Palmer, J.W.
Factor analysis has been used to resolve the overlapping XPS spectra obtained in the x-ray-induced transformation of Pt(en)2(OH)2Cl2 to Pt(en)2Cl2. This is achieved without prior knowledge of the data set nor the establishment of any initial curve fitting criteria.