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Application of Factor Analysis to the Resolution of Overlapping XPS Spectra

Volume 36, Number 4 (Aug. 1982) Page 428-430

Gilbert, R.A.; Llewellyn, J.A.; Swartz, W.E.; Palmer, J.W.

Factor analysis has been used to resolve the overlapping XPS spectra obtained in the x-ray-induced transformation of Pt(en)2(OH)2Cl2 to Pt(en)2Cl2. This is achieved without prior knowledge of the data set nor the establishment of any initial curve fitting criteria.