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Some Parameters Affecting Auger and Photoelectron Spectroscopy as an Analytical Technique
Volume 23, Number 1 (Feb. 1969) Page 41-50
Yin, L.I.; Adler, I.; Lamothe, R.
Various possibilities of Auger and photoelectron spectroscopy as an analytical technique are discussed. In some applications simple electrostatic analyzers with coarse resolution may suffice and even be preferable. Typical spectra obtained with a hemispherical electrostatic analyzer of 0.6% energy resolution are presented and discussed. Such factors as sample thickness, sample potential, surface contamination, and incident angle of the exciting x rays have been found to affect the quality and character of the observed spectra. These results characterize some of the features, problems, and capabilities of applied Auger and photoelectron spectroscopy.