holder

The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.


Precision Transducer for High Pressure Infrared Measurements

Volume 23, Number 2 (April 1969) Page 157-159

Fox, J.V.; Prengle, H.W.


An externally mounted high pressure semiconductor strain gauge transducer of high precision is described which was used in connection with liquid ir absorption and PVT measurements up to 10 000 atm pressure. The transducer is nonlinear, but can be calibrated by a three point procedure, one point of which is the freezing point of mercury at 0°C, and fit to a derived mathematical function. The precision of the device is approximately 0.8 atm, with a repeatability of 5.5 parts in 10 000, at a level of 10 000 atm.