holder

The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.


Optimization of Precision and Accuracy in X-Ray Fluorescence Analysis of Silicate Rocks

Volume 39, Number 4 (Aug. 1985) Page 697-703

Bower, Nathan W.


The precision of XRF measurements on a Rigaku 3064 has been determined for 10 major and 12 trace elements in 10 geochemical reference rocks. A complete procedure for evaluating the sources of imprecision in XRF analyses is presented with new equations and data demonstrating that for many measurements a minute is an adequate count time for obtaining the minimum error (1% RSD) in an analysis. Longer analysis times were found to be limited by sample preparation errors, and for very long analysis times, the precision is predicted to get worse.