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Optimization of Precision and Accuracy in X-Ray Fluorescence Analysis of Silicate Rocks
Volume 39, Number 4 (Aug. 1985) Page 697-703
Bower, Nathan W.
The precision of XRF measurements on a Rigaku 3064 has been determined for 10 major and 12 trace elements in 10 geochemical reference rocks. A complete procedure for evaluating the sources of imprecision in XRF analyses is presented with new equations and data demonstrating that for many measurements a minute is an adequate count time for obtaining the minimum error (1% RSD) in an analysis. Longer analysis times were found to be limited by sample preparation errors, and for very long analysis times, the precision is predicted to get worse.