ATTENTION: This site is down for maintenance in read-only mode.

The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.

Sample Spinning in X-Ray Spectrometry

Volume 39, Number 5 (Oct. 1985) Page 881-882

Ellis, A.T.; Leyden, D.E.

Sample rotation during x-ray spectrometric analysis has been a point of some controversy. Traditionally, wavelength-dispersive x-ray spectrographs contain the capability of sample rotation as a standard feature. However, many energy-dispersive spectrometers are not so equipped. The argument for sample rotation has been based upon the averaging of inhomogeneities in the sample during the counting period. The argument against the need for a sample spinner feature has often been that the sample must be prepared to be homogeneous for proper x-ray analysis. It is important, however, to understand the nature of the inhomogeneity in question.