The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.
Infrared Emission Spectroscopy. I. Basic Considerations
Volume 26, Number 1 (Feb. 1972) Page 73-76
Griffiths, Peter R.
The basic principles behind the characterization of compounds by ir emission spectroscopy have been illustrated using surface films of silicone grease and gaseous samples. Anomalous features in the spectra are accounted for by considering the absorption of emitted radiation by less thermally excited molecules in the path to the detector. It is suggested that ir emission spectroscopy can be used easily to characterize thin layers on heated specular mirrors or hot vapors at low pressure, but care must be taken in the interpretation of results for thick layers of gases at high pressure, when the temperature of the emitter is close to that of the detector, or when molecules are to be characterized on substrates whose emissivity is high.