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X-ray Photoelectron Spectroscopic Studies of Valence States Produced by Ion-Sputtering Reduction

Volume 26, Number 3 (June 1972) Page 355-357

Yin, Lo I.; Ghose, Subrata; Adler, Isidore


X-ray photoelectron spectroscopic measurements of various valence states of Fe and Cu in several compounds using ion-sputtering reduction are presented, and the potential usefulness of this time-dependent and in situ method is discussed.