The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.

Characteristics, Performance, and Quantitative Analytical Capability of an Energy-Dispersive Spectrometer on an Electron Microprobe Using Low Operating Voltages

Volume 27, Number 6 (Dec. 1973) Page 456-464

Desborough, George A.; Heidel, Robert H.

An investigation was made of the analytical capability of a Si(Li) x-ray detector for energy-dispersive techniques in the 1- to 10-keV photon energy range with multiple single channel analyzers using the electron microprobe beam as the excitation source at operating voltages of 10 to 20 kV. This system can provide rapid, accurate, simultaneous, quantitative elemental microanalysis of major constituents in complex solids for all elements heavier than Si where spectral interferences are absent and reference standards are used. Calculated theoretical detection limits are about 0.2 wt%. A relative precision of about 1 to 5% is routine for a 10- or 20-sec counting period for elements in concentrations above about 5 wt%. Data for K, L, and M x-ray spectra of representative elements ranging in energy from 1.25 to 8.64 keV are presented for operating voltages of 10, 15, and 20 kV and beam currents of 1 to 10 nA.