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Detection of Spectral Overlap Interference in ICP-AES with an Empirical Linewidth Ratio Technique

Volume 40, Number 7 (Oct. 1986) Page 944-948

Farwell, S.O.; Kagel, C.T.

ICP-AES line intensity data were fitted to a minimum-curvature smooth curve generated with the aid of a cubic semispline algorithm. These spline-fitted curves were used to obtain linewidth ratios which can provide accurate indication of spectral overlap with the use of only sample and standard spectra.