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Quantitative X-Ray Fluorescence Spectrometry of Irregularly Shaped Samples Using Fundamental Parameters Software

Volume 41, Number 8 (Dec. 1987) Page 1455-1457

Bilbrey, D.B.; Leyden, D.E.; Harding, A.R.

Industrial analytical laboratories often receive a wide variety of specimens that require elemental determinations. For solid samples, x-ray fluorescence spectrometry (XRF) is frequently the method of choice. One usually prepares solid samples, such as alloys, for XRF analysis by cutting pieces from bulk solids to fit into the sample holder. A usual requirement for XRF is that the specimen have a flat, smooth surface. Irregularly shaped specimens are not always amenable to direct analysis. If part of the sample already has a flat area, it can be analyzed with the use of a mask or a selected area aperture. Small fragments can be analyzed by the use of beam collimation or a pinhole aperture. Although masking or beam collimation methods can be used, often they are not practical because of reduced intensity, which leads to excessive analysis times. The effective specimen area must be the same for both standards and unknowns.