The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.

Increasing Detectivity of Polarization Modulation Infrared ReflectionAbsorption Spectroscopy for the Study of Ultrathin Films Deposited on Various Substrates

Volume 57, Number 10 (Oct. 2003) Page 1260-1265

Saccani, J.; Buffeteau, T.; Desbat, B.; Blaudez, D.

In this paper, we present a simple way to increase the sensitivity of polarization modulation infrared reflection-absorption spectroscopy (PM-IRRAS) for the study of ultrathin films deposited on dielectric and semiconductor substrates. The enhancement of the absorption band intensity is obtained by reducing the signal arising from the substrate. This is achieved by adding a polarizer after the sample in order to balance the polarized reflectivities of the sample. As a consequence, the contribution of the film to the PM-IRRAS signal is increased relative to that of the substrate. An enhancement factor of about 10 has been obtained for ultrathin organic films deposited on glass and spread at the air-water interface. This method has also allowed the study of the very thin native oxide layer present on silicon without the need for the reference spectrum of bare silicon.