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Rotational Invariants for Polarized Raman Spectroscopy

Volume 57, Number 9 (Sept. 2003) Page 1053-1057

Frisk, S.; Ikeda, R.M.; Chase, D.B.; Rabolt, J.F.

A new method has been developed to determine an orientationindependent Raman scattered intensity based on various polarized Raman measurements. The equivalent term in infrared spectroscopy is the structural absorbance, which has existed for many years. As with the structural absorbance, the calculated Raman intensity allows one to observe spectral changes that are due uniquely to morphological changes in a set of different samples in the presence of orientation differences. The full theoretical development is presented, followed by an example based on a set of polymer fibers processed under different conditions leading to different morphologies and degrees of molecular orientation.