holder

The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.


Characterization of Chemical Bonding in Ion-Implanted Polymers by Means of Mid-Infrared Reflectivity

Volume 63, Number 9 (Sept. 2009) Page 1022-1026

Ivanov, Victor G.; Hadjichristov, Georgi; Faulques, Eric


An optical approach for structural characterization of the modified surface layer in ion-implanted polymers is proposed. The mid-infrared reflectivity from the implanted surface is analyzed in terms of an oscillator dispersion model combined with the theory of differential reflection spectroscopy. The degree of destruction of a specific chemical bond is determined by the relative drop of the oscillator strengths associated with the corresponding vibrational modes. As an example, this methodology is applied to poly(methylmethacrylate) (PMMA) implanted with 50 keV silicon ions at fluences in the range 3 × 1014 to 1 × 1017 ions/cm2. The scission rates for the C=O, C-O-C, and C-H bonds, as well as the static dielectric constant of the ion-modified material, are calculated as a function of the ion fluence. Further, a lower-limit estimate of 120 nm for the thickness of the ion-modified layer is obtained.