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Some Signal Characteristics in Direct Sample Insertion-Inductively Coupled Plasma-Atomic Emission Spectrometry
Volume 44, Number 3 (April 1990) Page 525-530
Chan, W.T.; Horlick, G.
Direct sample insertion (DSI) is a particularly attractive method for sample introduction for inductively coupled plasma-atomic emission spectrometry (ICP-AES). In this approach a sample is placed into or onto a probe with subsequent introduction of the sample carrying probe, via the central tube of the torch, into the plasma. An extensive review of DSI devices for the ICP has been presented by Karanassios and Horlick.