The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.
Polarization Modulation FT-IR Spectroscopy of Surfaces and Ultra-thin Films: Experimental Procedure and Quantitative Analysis
Volume 45, Number 3 (April 1991) Page 380-389
Buffeteau, T.; Desbat, B.; Turlet, J.M.
Polarization modulation of the incident electromagnetic field is used to increase the sensitivity and the in situ experiment ability of the well-known method of reflexion absorption FT-IR spectroscopy, for the characterization of surfaces and ultra-thin films. The experimental procedure and signal processing of the detected intensity are described and illustrated with the use of results obtained with Langmuir-Blodgett monolayers. The quantitative analysis of the spectra is then developed, and a linear behavior of the band intensities is found for ultra-thin films exhibiting no strong absorptions. This result is checked with the use of organic and inorganic ultra-thin films of increasing thicknesses.