The following is an abstract for the selected article. A PDF download of the full text of this article is available here. Members may download full texts at no charge. Non-members may be charged a small fee for certain articles.
A Low-Cost Reflectance FT-IR Microscope
Volume 45, Number 7 (Aug. 1991) Page 1149-1152
Jansen, J.A.J.; Van Der Maas, J.H.; Posthuma De Boer, A.
A Fourier transform infrared spectroscopy (FT-IR) microscope combines microscopy with infrared (IR) spectroscopic molecular characterization. IR microspectroscopy presents a well-established and useful analytical tool, though at relatively high cost. A low-cost reflectance FT-IR microscope has been developed. The configuration consists of a diffuse reflectance cell, extended to include a diaphragm, a monocular, and an x-y-z stage in combination with an FT-IR spectrometer. The experimental setup is presented in detail. The assembly attains a spot size of 0.3 mm and detection limits in the nanogram range. The potentialities and applications of the low-cost reflectance FT-IR microscope are demonstrated by various examples in the field of polymeric material and product characterization.