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An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers

Volume 46, Number 1 (Jan. 1992) Page 131-135

Scimeca, T.; Andermann, G.

The variable-exit-angle ultrasoft x-ray fluorescence technique has been evaluated for Ni/Fe thin-film multilayers. The theoretical and experimental agreement is reasonable. The experimental results demonstrate that on these Ni/Fe samples quantitative information can be obtained in the presence of surface contamination.