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Determination of Organics on Metal Surfaces by Raman Spectroscopy

Volume 47, Number 11 (Nov. 1993) Page 1767-1771

Tseng, Ching-Hui; Mann, Charles K.; Vickers, Thomas J.

Detection limits of about 1 g/m2 are demonstrated for the Raman determination of two organic materials, polydimethylsiloxane and dimethyl methylphosphonate, on an aluminum surface. A fiber-optic-based system is used. A large sample area is scanned to overcome heterogeneity in sample coverage. Measurements are made without use of an internal standard. Results are reported for both a Hadamard transform technique with argon-ion laser excitation and a conventional spectrometer with diode laser excitation.