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Infrared Reflection Absorption Spectroscopy of Naturally Grown Oxide Films on Chrome and the Dependence of the Berreman Effect on Film Thickness

Volume 51, Number 6 (June 1997) Page 844-848

Scherubl, Th.; Thomas, L.K.


The thickness dependence of the Berreman effect for naturally grown oxide films on chrome is analyzed theoretically and experimentally. The shift of the spectral position of the Berreman minimum can be described by the Fuchs-Kliewer theory of virtual modes. Both the absorption and the shift of the position can be used for thickness determination. The experimental results compared with calculated values based on different optical constants for Cr2 O3 indicate their influence on the position and the absorption of the Berreeman minimum.